IEC61032Test Probe B Jointed finger probe

Place Of Origin
China
Minimum Order
1
Packaging
1 pcs/box or bulk packing
Delivery
7 Days

IEC61032Test Probe B Jointed Finger probe

key words:Test Probe B, Jointed Probe


This jointed test probe B is intended to verify the basic protection against access to hazardous parts. It's also used to verify the protection against access with a finger.

Conforms to:

This is the "international" test probe required by most IEC, EN and CSA standards, in addition to many UL standards. The Jointed Finger Test is a high-precision probe built in exact accordance with IEC standards such as IEC 60950, IEC 61010, and IEC 61032 and is also used for CSA and UL standards.


Notes:

Both joints shall permit movement in the same plane and the same direction through an angle of 90o with a 0o to +10o tolerance.

Technical Parameters:

Kunrled finger diameter 12mm Knurled Finger length 80mm Baffle plate diameter 50mm Baffle plate length 100mm Baffle thickness 20mm
  • Country: China (Mainland)
  • Business Type: Manufacturer,Trading Company
  • Market:Americas,Africa,Asia,Emerging Markets,Europe,G20,Middle East,Oceania
  • Founded Year:2013
  • Address:宝安区西乡大道丰和园1F
  • Contact:Bella Zhou
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