The SD solution is designed for test, debug, validation, and programming of eMMC, eMCP devices
The SD solution provides a compact test solution for eMMC, eMCP devices used in applications such as handheld, mobile, and TV product development.
Feature:
Mechanical Socket Body: Torlon Socket Lid: Aluminum Alloy Contact: Spring Probe Operation Temperature: -40ºC to 120ºC Life Span at Operating Travel:100K Cycles min. Cycles Spring Force:27gf per Pin |
Electrical Current Rating (Continuous) : 2.59A Self Inductance:1.57nH Bandwidth -1dB:10GHz DC Resistance: 42mohm |