Image Analysis Software

Image Analysis Software
analySIS FIVE
Digital Camera
DP72
DP25
DP20
XC10
SC20
UX30
XC30
XC50
E330M1.2x

Automatic Wafer Loaders
AL120-128
Thin Wafer Auto Loader
AL110

Inverted Metallurgical Microscopes
GX71/GX51
GX41

Confocal Laser Scanning Microscopes / Deep UV
LEXT OLS3100
U-UVF248

Semiconductor Inspection Microscopes
MX61A
MX61L
MX61
MX51

Stereozoom Microscopes
SZX16
SZX10
SZX7
SZ61/SZ51
Stand and Base Line Up
Illuminator Line Up

Measuring Microscopes
STM6-LM
STM6
MM6-FN

Polarizing Microscope
CX31-P
BX41-P
BX51-P

analySIS particle inspector
analySIS filter inspector
analySIS inclusion inspector
Metallurgical Microscopes
BX61
BX51
BX51M
BX51-IR
BX41M-LED
BXFM-S

Grain Sizing - Planimetric Method
Layer thickness & coating measurement(calopreps)
Cast Iron analySIS
Weld Measurement
Classification of non-metallic inclusions
Comprehensive systems for dedicated applications
Turn-key solutions simple efficiency
All comprehensive systems commonly consist of a microscope, a motorized stage with controller, a digital camera and each dedicated analySIS software.

Particle Detection
Grain Sizing - Intercept Method

analySIS extensions
The software extensions (add-ins) perfectly match the analySIS FIVE series, thereby allowing to perform routine tasks in materials science efficiently and in accordance with international standards.

Image Analysis Software
Image Analysis Software
analySIS FIVE
A full array of software functions enables the user to process, measure and analyze images, and create a database and reports in one seamless manner. This is exclusively introduced into the Asian market.Function / Type ruler imager docu auto pro
Camera and microscope control X X X X X
Measurement X X X X X
Database N/A X X X X
Report function N/A X X X X
Image montaging N/A OP X X X
Expanded focus N/A OP X X X
3-D image N/A OP X X X
Particle analysis N/A OP OP X X
Fourier transformation N/A N/A OP OP X
X: Available,  N/A: Not available, OP: Option