Programmable Keyboard

Key Features Back to List Support component test scanning Support 8 slots for plug-in (removable), up to 320 channels for one unit Option A130007 40 channels scan module, input up to 500VDC for IR test without switching Max. 8 salve units for multiple scanner (master/slave interface) Support Chroma LCR meter Support Chroma 3302/3252/11025 turn ration function Support 11200 CLC/IR meter for IR test Standard RS232, GPIB and USB interface 13001 can be installed in Chroma Component ATE model 8800 Support ICT applications In the recent years, component is more complicated and more multiple. It makes all tests be performed which are very complicated and different. The problem is not only the course is complicated and apt to make mistakes, but also the manpower cost more. Chroma 13001 can perform switch and scan test for L, C, R etc measurement combine with LCR Meter (Chroma model 3302/3252/11022/11025) include turn ration if the model has and IR test combine with Chroma 11200 CLC/IR Meter. It also offers short function for leakage inductance measurement. One unit could plug-in modules up to 8 slots. It is up to 320 channels for one unit if combined with 8 of option A1130007 40 channels module. It provides master and slave designed and up to 8 salve units for multiple scanner. User can control the output test circuit through RS232, GPIB or USB interface. Chroma 13001 can be installed in Chroma 8800 Component ATE for DUT which a lot of procedures to test like RJ-45 equipment, glass substrate, LCD glass substrate, printed circuit glass, PCB, EMI filter ICT application. The 8800 ATS can save the manpower cost, reduce the mistake, data management to improve quality and efficiency