Quartz, Aluminium, Polycarbonate, Sapphire, Germanium, Acrylic
Substrate material
Photoresist, Polysilicon, Polyimide, Amorphous, Silicon, Polymer Film
Thin film layers
Some examples of materials
Light source Tungsten Halogen
Detector type 2048-element linear silicon CCD array
Layers Up to 4 layers
Sample size From 1mm and up
Spot size Adjustable 0.8mm to 1cm (10?m with a microscope)
Repeatability 0.1nm
Precision 0.2nm
Accuracy The greater of
hin films are widely used in a variety of applications and the Thin-Film Measurement System can easily determine their propertie
Delivery Time: | 30days |
Package: | carton |
Supply Ability: | 10 Set/Sets per Month |
Minimum Order Quantity: | 1 Set/Sets |
Payment Terms: | L/C,T/T |
Port: | Tianjin,China |
Fob Price: | US$9000-9800Tianjin,China |
Size: | 500*430*430mm |
Material: | Other |
Model Number: | SGC-10 |
Brand Name: | Gangdong |
Place of Origin: | Tianjin China (Mainland) |
DM-520/530 DM-5xx series is our most flexible optical measurement solution that address versatile display measurement. We can offer you anoptical measurement system Optimized for displays up to 34-50”. Ideal for conventional TV, mainly for computer monitor and flat TV. ...
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3D Optical Measurement System , Digital Video Measurement System Applicability: 3D Optical Measuring System can complete all the measuring request and especially fit for the workshop and measurement lab,widely used in aviation, aerospace, defense, automotive, mold and ...
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